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Webinar: Full Surface Angstrom level Defect Detection on thin glass samples - encore
Dr. Steven Meeks will present the Lumina Optical Scanner which does full surface imaging, defect detection and classification. The Lumina AT1 enables the scanning of circular, non-circular, fragile or irregular shaped samples. The AT1 accommodates transparent, silicon, compound semiconductor, or metal substrates, with sizes up to 300-mm x 300-mm.

Aug 6, 2020 10:30 AM in Osaka, Sapporo, Tokyo

Webinar is over, you cannot register now. If you have any questions, please contact Webinar host: Robert Kertayasa.