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High-Resolution Kelvin Probe, Conductivity and Mechanical Measurements on Advanced Materials
An overview of electrical and mechanical measurements using advanced modes in Scanning Probe Microscopy will be presented. We will then move on to discuss modern high-resolution modes such as HD-KFM, ResiScope and SoftIC, which are unique features available on the new GALAXY DUAL controller. Layers of graphene and MoS2 can only be resolved with high-sensitivity and high-resolution kelvin probe microscopy. ResiScope is a conductance technique with a wide range of 10 decades, which can easy resolve the staircase doping profile of SiC doped sample, as well as nanoparticles and complex alloys. True topography and mechanical properties on soft polymer samples like PMMA, PS, PDMS and PDES are only achieved with the soft intermittent contact mode.

Jul 28, 2020 11:00 AM in Sao Paulo

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