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Webinar: Full Surface Angstrom level Defect Detection on thin glass samples
Dr. Steven Meeks will present the Lumina Optical Scanner which does full surface imaging, defect detection and classification. The Lumina AT1 enables the scanning of circular, non-circular, fragile or irregular shaped samples. The AT1 accommodates transparent, silicon, compound semiconductor, or metal substrates, with sizes up to 300-mm x 300-mm.

Aug 4, 2020 11:00 PM in Osaka, Sapporo, Tokyo

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