webinar register page

Webinar banner
Thin Film Analyzer - Physical properties of thin-films
Register for our webinar "Thin Film Analyzer" and learn all about the analysis of physical properties of thin-films such as for semiconductors.
Dr. Hans W. Marx will present you the LINSEIS TFA, which can be used to measure e.g. Van der Pauw, Seebeck coefficient, and thin-film thermal conductivity.
Webinar logo
* Required information
Loading

By registering, I agree to the Privacy Statement and Terms of Service.

Register

Speakers

Dr. Hans-W. Marx
Sales Manager & Technical support @Linseis Thermal analysis