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From Centimeter to Micrometer - Laser-assisted Microdiagnostic Sample Preparation
Preparation of a sample can take a while and is often challenging. In times when the production of materials and products becomes more and more complex, and components are getting smaller, also test, analysis, and diagnostics methods are becoming more complex and expensive. There will be a high need to speed up these processes, simplify them in advance and tailor them to the appropriate procedures.

Ultra-short-pulsed laser based sample preparation can speed up the preparation and widen the prep-ability in the field of microstructures and beyond. Due to the high ablation rates new specimen designs are possible which open up new opportunities for R&D and material analysis.

This webinar will show general approaches for:

• Cross sections for high resolution SEM analysis by box and line cuts
• Preparation of micromechanical test samples
• Milling of pillars and cylindrical samples for X-CT and Atom Probe Tomography
• Preparation of TEM lamellas even from complex and bulky devices

Nov 12, 2020 11:00 AM in Eastern Time (US and Canada)

Webinar is over, you cannot register now. If you have any questions, please contact Webinar host: Ashley Carey.