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TOPIQ | Thin Film XRD application by SmartLab
The new SmartLab multipurpose X-ray diffractometer for various thin-film applications will be presented. The key optical components required for high quality XRD measurements together with the unique in-plane/out of plane goniometer will be discussed. The usage of the non-coplanar condition (superposition of out of plane and in-plane arms) for high quality large range pole figures and in-plane residual stress measurements will be shown. Examples of fast and wide range reciprocal space maps and high quality rocking curves obtained by combining SmartLab with the HyPix3000 area detector are included in this webinar.
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