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External PIM mitigation – Kaelus 2-Port PIM Finder Solution
Do you want to know more about Passive Intermodulation and External PIM? Are you part of a crew dealing with the difficult task of mitigating external PIM on B17 and B14 sites?

Kaelus is delighted to invite you to its online event External PIM mitigation – Kaelus 2-Port PIM Finder Solution on Wednesday, March 2nd, 2022 at 2:00 PM ET | 11:00 AM PST

Join Christine Blair, VP of R&D for Kaelus Test and Measurement, and Tom Bell, Executive VP of Product Line management for ConcealFab to discuss External PIM Finding and mitigation process for B14 and B17.

The agenda will cover the following:

- Why is External PIM an increasing concern?
- The key Aspect of External PIM finding
- External PIM finding: What do I need?
- External PIM mitigation Process using Kaelus PIM Finder Solution and ConcealFab material.

01:06:00

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Speakers

Tom Bell
EVP Product Line Management @ConcealFab
Tom Bell is the Executive Vice President of Product Line Management at ConcealFab corporation, where he leads a team to develop solutions to mitigate external passive intermodulation at cell sites. Prior to joining ConcealFab, Tom spent six years working in the PIM test equipment industry as a product manager and 15 years in the base station antenna manufacturing industry in a variety of roles including sales, marketing, operations management, and engineering management. Tom has been an active participant in TC 46, WG 6 since 2013.
Christine Blair
VP R&D and Product Management Test and Measurement solutions @Kaelus
With 25 years’ experience in the telecommunication industry, Christine Blair has developed expertise in conceiving and leading the development of new product ideas and their transformation into successful differentiated products. She is the Vice President of Research and Development for Kaelus, responsible for the product line management and R&D for Kaelus Test and Measurement. Christine graduated from the Australian Institute of Business with a Master in Business Administration and she holds an Electronic Engineering Degree from the Institut Supérieur de l’Electronique et du Numérique, a leading institution in France.